Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications 1st Edition
Book Name: Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications 1st Edition
Author: Manuel Servin , J. Antonio Quiroga, Moises Padilla
Publisher: Wiley-VCH
ISBN: 3527411526
Year: 2014
Pages: 344
Language: English
File format: PDF
Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications 1st Edition Pdf Book Description:
The most important purpose of this publication is to present the fundamental theoretical principles and practical programs to the classical interferometric methods and the most innovative methods within the business of contemporary fringe pattern analysis employed to optical metrology.
A significant novelty of the work is the demonstration of a unified theoretical framework based on the Fourier description of phase shifting interferometry with the Frequency Transfer Function (FTF) together with the concept of Stochastic Process for its simple evaluation and synthesis of phase altering algorithms with desirable properties like spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc..
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